Smart Factory

Machine Vision

Defect Detection / Form Classification
Counting algorithm
Optimal Lighting and Image Configuration

X-Ray 2.5D Video Anaysis

Chip Counter

Samsung Electronics Network Div.

HiP Detection

IBM New York


Fringe height measurement based Projection

Shadow removal
Metal reflection

High-speed 3D algorithm based on X-ray transmission

Low-dose osem statistical model
GPU-based parallelism fast fw/bw projection

Rail Vision

Line-scan optical system for robots
Railhead surface inspection-Flag detection
Train detection and trackingn