Smart Factory
Defect Detection / Form Classification

Counting algorithm

Optimal Lighting and Image Configuration

X-Ray 2.5D Video Anaysis
Chip Counter
Samsung Electronics Network Div.
HiP Detection
IBM New York
3D AOI+3D AXI
Fringe height measurement based Projection
Shadow removal
Metal reflection

High-speed 3D algorithm based on X-ray transmission
Low-dose osem statistical model
GPU-based parallelism fast fw/bw projection

Rail Vision
Line-scan optical system for robots

Railhead surface inspection-Flag detection

Train detection and trackingn
